Application Catalog


27 - Head Field Analysis of Recording Write Head with Effects of Eddy Current <TR>


Overview
Head Field Analysis of Recording Write Head with Effects of Eddy Current
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A magnetic head has a recording head that writes data to a round magnetic disk, and a playing head that reads data. For the recording write head, the magnetic flux density distribution around the head and the response of the head field to input electric signals are the important characteristics for its performance evaluation. To study these characteristics, the analysis must include the effects of eddy currents generated on a yoke.
This example presents the use of magnetic field analysis of the recording write head with the effects of eddy currents on the yoke, to evaluate the response characteristic of the head field.

Eddy Current Density Distribution / Magnetic Flux Density Distribution
Fig. 1 shows the eddy current distribution around the head, and Fig. 2 shows the magnetic flux density distribution. As shown in the eddy current density distribution, eddy currents are generated on the surface of the yoke. This eddy current interrupts the flow of the magnetic flux, resulting in reduced responsiveness of the head field to the magnetomotive force.
Head Field Analysis of Recording Write Head with Effects of Eddy Current:Eddy Current Density Distribution / Magnetic Flux Density Distribution
Closeup
Head Field Analysis of Recording Write Head with Effects of Eddy Current:Eddy Current Density Distribution / Magnetic Flux Density Distribution
Closeup

Response Characteristic of the Head Field
Fig. 3 shows the response characteristic of the head field. The head field waveform is behind the magnetomotive force waveform. This is caused not by the coil inductance but the eddy currents on the yoke. When analyzing the response of the write head, the analysis must include the effects of eddy currents. Head Field Analysis of Recording Write Head with Effects of Eddy Current:Response Characteristic of the Head Field
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Reference:
K. Fujiwara, F. Ikeda, A. Kameari, Y. Kanai, K. Nakamura, N. Takahashi, K. Tani, and T.
Yamada, "Thin Film Write Head Field Analysis Using a Benchmark Problem," IEEE Trans.
Magn., vol.36, no.4, pp.1784-1787, July 2000.

Updated: 2011-07-12



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